landy 发表于 2018-3-6 13:50:07

AEC-Q100-008-rev-A EARLY LIFE FAILURE RATE (ELFR)

This test method is applicable to all IC part qualifications. In the case of many parts, generic data (see Q100, section 2.3) may fulfill the requirements of this test method. If the supplier is qualifying a part for which no generic data is available (unproven technology or design rules) for general usage then the requirements of this test method should be utilized to meet the requirements of Q100.

hunter5168 发表于 2018-3-6 16:13:49

:)

TBD16888 发表于 2018-3-7 00:59:14

感谢分享

叶平 发表于 2018-3-7 07:57:38

感谢分享...

xlj0121 发表于 2018-3-7 08:00:15

:)

billye 发表于 2018-3-7 08:20:45

感谢分享...

lurenjia2011050 发表于 2018-3-7 12:30:47

感谢分享

bds203 发表于 2018-3-7 13:25:37

:P:P

flyerchang 发表于 2022-11-6 15:59:39

谢谢分享

haiquanzhou 发表于 2023-10-30 10:36:15

感谢分享
页: [1] 2
查看完整版本: AEC-Q100-008-rev-A EARLY LIFE FAILURE RATE (ELFR)