sunjj 发表于 2025-1-16 13:59:51

IEC 63287-1-2021 Semiconductor devices – Generic semiconductor qualificatio...

IEC 63287-1-2021 《Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification》 文件比较大，35MB, 放在阿里云盘。

IEC 63287-2:2023 《Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile》

https://www.pinzhi.org/thread-99693-1-1.html

Texsus 发表于 2025-1-16 19:20:43

IEC 63287-1-2021

Marcel 发表于 2025-1-17 00:59:12

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maijie 发表于 2025-1-17 08:08:23

谢谢分享

y7a1n3 发表于 2025-1-17 08:16:41

{:1_180:}

TBD16888 发表于 2025-1-17 09:39:41

谢谢分享

G_Darius 发表于 2025-1-17 12:55:11

感谢分享

yesmyboy1 发表于 2025-1-20 13:49:36

謝謝分享

namixiaoxin 发表于 2025-2-14 08:26:11

楼主原来是可靠性网的，转战到这边来了！
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