xiaming1984 发表于 2022-5-30 08:24:38

AECQ102标准: AEC - Q102 - Rev - March 15, 2017

车规封装器件可靠性标准 FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR DISCRETE OPTOELECTRONIC SEMICONDUCTORS IN AUTOMOTIVE APPLICATIONS

AEC-Q102 Failure Mechanism Based Stress Test Qualification for Discrete Optoelectronic Semiconductors in Automotive Applications

Appendix 1: Definition of a Qualification Family
Appendix 2: AEC-Q102 Certification of Design, Construction and Qualification
Appendix 3: AEC-Q102 Qualification Test Plan
Appendix 4: Data Presentation Format
Appendix 5: Minimum Parametric Test Requirements and Failure Criteria
Appendix 6: Destructive Physical Analysis (DPA)
Appendix 7: Guideline on Relationship of Robustness Validation to AEC-Q102
Appendix 7a: Reliability Validation for LEDs

xiaming1984 发表于 2022-5-30 14:25:17

这份标准看懂了，车载封装器件的实验室就可以搞定了

xiaming1984 发表于 2022-5-30 08:25:28

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volanszhangb 发表于 2022-5-30 09:07:25

谢谢分享

xiaming1984 发表于 2022-5-30 23:04:08

顶一下

xiaming1984 发表于 2022-5-31 00:19:54

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xiaming1984 发表于 2022-6-1 16:19:15

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xiaming1984 发表于 2022-6-1 18:47:22

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xiaming1984 发表于 2022-6-1 23:32:05

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xiaming1984 发表于 2022-6-2 15:27:36

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