车规封装器件可靠性标准 FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR DISCRETE OPTOELECTRONIC SEMICONDUCTORS IN AUTOMOTIVE APPLICATIONS
AEC-Q102 Failure Mechanism Based Stress Test Qualification for Discrete Optoelectronic Semiconductors in Automotive Applications
Appendix 1: Definition of a Qualification Family
Appendix 2: AEC-Q102 Certification of Design, Construction and Qualification
Appendix 3: AEC-Q102 Qualification Test Plan
Appendix 4: Data Presentation Format
Appendix 5: Minimum Parametric Test Requirements and Failure Criteria
Appendix 6: Destructive Physical Analysis (DPA)
Appendix 7: Guideline on Relationship of Robustness Validation to AEC-Q102
Appendix 7a: Reliability Validation for LEDs
发表于 2022-5-30 08:24:38
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发表于 2022-5-30 09:07:25
