wodotar201
发表于 2024-10-25 11:56:31
JESD22-C101-C
JEDEC
STANDARD
Field-Induced Charged-Device Model
Test Method for Electrostatic-
Discharge-Withstand Thresholds of
Microelectronic Components
flyerchang
发表于 2024-10-26 17:15:50
谢谢分享
yesmyboy1
发表于 2024-11-3 15:32:00
謝謝分享
flyerchang
发表于 2024-11-5 12:05:30
谢谢分享
Texsus
发表于 2024-11-22 09:03:20
感谢分享
chri.mpeg
发表于 2024-12-25 09:56:05
:)
flyerchang
发表于 2025-1-5 19:12:29
谢谢分享
页:
[1]