wodotar201 发表于 2024-10-25 11:56:31

JESD22-C101-C

JEDEC
STANDARD

Field-Induced Charged-Device Model
Test Method for Electrostatic-
Discharge-Withstand Thresholds of
Microelectronic Components


flyerchang 发表于 2024-10-26 17:15:50

谢谢分享

yesmyboy1 发表于 2024-11-3 15:32:00

謝謝分享

flyerchang 发表于 2024-11-5 12:05:30

谢谢分享
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